CAMIO7 extends probing support with high performance SP80 and enhances reporting tool

The latest CAMIO7.2 version now supports the ultra-high accuracy fixed head SP80 scanning probe. The Renishaw SP80 scanning probe achieves class-leading scanning performance and flexibility when combined with Nikon Metrology’s high quality ceramic bridge CMMs. SP80 is set to become the CMM scanning probe of choice for automotive power train applications, where high accuracy form measurement, with deep reach into components, is required. Full integrated within Nikon Metrology’s productivity-focused CAMIO software platform, with intuitive programming tools and reporting for prismatic shape inspection, the SP80 can carry styli up to 800mm long and 500g mass, including star configurations which do not require counterbalancing.

SP80 ultra-high accuracy scanning probe

Also new in 7.2 is the tool change manager that automatically executes all change sequences and eliminates the need for user programming. Inspection programs can be ported from offline programming stations, or from one CMM to another, without modification or moving the change rack. For maximum flexibility multiple and mixed rack types are also support on the same CMM.

The new integrated reporting package is up to 60% more productive, with inspection reports created in real-time during the measurement cycle. This time-saving empowers manufacturers with an invaluable heads up and enables a more efficient response to decisions effecting product quality. Standard reports templates facilitate instant reporting, while configuration tools provide the flexibility to create bespoke designs. Tabulated tables, graphical reports and form plots can now be combined in one concise report, and shared with a wider audience using popular Microsoft and Adobe file formats.

About Nikon Metrology

Nikon Metrology offers the broadest range of metrology solutions for applications ranging from miniature electronics to the largest aircrafts. Nikon Metrology’s innovative measuring and precision instruments contribute to a high performance design-through-manufacturing process that allows manufacturers to deliver premium quality products in a shorter time. Further information is available on http://www.nikonmetrology.com/