New LC60Dx brings CMM laser scanning in the accuracy range of tactile measurement

Leuven, May 4 - At the international 2010 Control trade fair for quality assurance, Nikon Metrology introduces the all-digital LC60Dx / LC50Cx scanners. The next-generation LC60Dx CMM laser scanner, evolved from the successful LC60D scanner, brings laser scanning in the accuracy range of tactile measurement. The affordable, yet powerful LC50Cx scanner features higher scanning rate and captures surfaces of varying color and high reflectivity without user interaction. Nikon Metrology also presents new subreleases of Focus and Camio.

Nikon Metrology, a new Nikon daughter company, markets the products of former Metris and the industrial inspection solutions of the Nikon Instruments division. Building on the legacy of being a leading innovator in non-contact metrology, Nikon Metrology introduces exciting laser scanning solutions for CMM and handheld applications.

Realizing high scanning accuracy and speed

Nikon Metrology introduces the all-digital LC60Dx scanner with powerful CMOS technology, an evolution from the LC60D CMM laser scanner. The major improvement for LC60Dx is higher accuracy, resulting in a typical MPEp value of 7 micron according to EN ISO 10360-5. This brings the scanner in the accuracy range of tactile measurement, while capturing 75,000 measurement points a second. By acquiring a multitude of measurement points, LC60Dx reliably digitizes freeform shapes and supports highly accurate feature extraction. Also new in the LC family is the LC50Cx laser scanner. This entirely digital scanner benefits from an upgraded scanning rate of 45 stripes per second and the same Enhanced Sensor Performance of the 3rd generation (ESP3) as the LC60Dx. Through ESP3 technology, LC scanners digitize surfaces with varying color, high reflectivity or abrupt transitions under any lighting conditions by dynamically adapting laser beam intensity point per point. Altogether, the LC50Cx is an affordable, yet powerful CMM scanner offering adequate productivity for a broad range of inspection and reverse engineering applications. Faster and more versatile point metrology software Defining scanner motion paths for a laser scanning inspection job is straightforward compared to the traditional programming of many touch sensor points. The new 6.3 subrelease of Camio software speeds up data acquisition even further. New in this regard is the so-called Fly-by Scanning mode. Using this mode, the software automatically calculates optimum and continuous scanner motion path curves, resulting in up to 25% faster scanning and simplified programming.

Furthermore, Focus Inspection 9.2 offers a complete set of functions for digital surface and feature inspection. It instantly delivers geometric feedback that is essential in tuning final part design and monitor product quality in the fabrication process. In addition to supporting infinite point cloud size on 64-bit computers, Focus introduces extended language support, CATIA V5 file import, enhanced feature extraction and new GD&T capabilities compliant with the ASME Y14.5M standard.

Read more on the LC60Dx / LC50Cx

ABOUT NIKON METROLOGY
Nikon Metrology offers the broadest range of metrology solutions for applications ranging from miniature electronics to the largest aircrafts.  Nikon Metrology’s innovative measuring and precision instruments contribute to a high performance design-through-manufacturing process that allows manufacturers to deliver premium quality products in a shorter time. Further information is available on www.nikonmetrology.com. 

For further information please contact:
Renaat Van Cauter, Director Marketing Communications
Nikon Metrology NV
Geldenaaksebaan 329
B3001 Leuven
Belgium
Renaat.vancauter@nikonmetrology.com
Tel +32 16 74 01 00 – Mobile +32 486 64 24 33